Information card for entry 4068162

Structure parameters

• Formula: C26 H20 B F15 Si2
• Calculated formula: C26 H20 B F15 Si2
• SMILES: [Si]([C@H](c1c(F)c(F)c(F)c(F)c1F)B([C@H]([Si](C)(C)C)c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F)(C)(C)C.[Si]([C@@H](c1c(F)c(F)c(F)c(F)c1F)B([C@@H]([Si](C)(C)C)c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F)(C)(C)C
• Title of publication: Insertion Reactions of Diazomethanes and Electrophilic Boranes
• Authors of publication: Neu, Rebecca C.; Stephan, Douglas W.
• Journal of publication: Organometallics
• Year of publication: 2012
• Journal volume: 31
• Journal issue: 1
• Pages of publication: 46
• a: 9.7676 ± 0.0015 Å
• b: 15.44 ± 0.002 Å
• c: 19.306 ± 0.003 Å
• α: 90°
• β: 98.467 ± 0.006°
• γ: 90°
• Cell volume: 2879.8 ± 0.7 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0808
• Residual factor for significantly intense reflections: 0.042
• Weighted residual factors for significantly intense reflections: 0.0814
• Weighted residual factors for all reflections included in the refinement: 0.0934
• Goodness-of-fit parameter for all reflections included in the refinement: 1.01
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No