Information card for entry 4068280

Structure parameters

• Formula: C42 H55 N2 P2 Pd Rh Si2
• Calculated formula: C42 H55 N2 P2 Pd Rh Si2
• SMILES: [Pd]123([N](=P(C41[Rh]156([N](=P4(c4ccccc4)c4ccccc4)[Si](C)(C)C)[CH]4=[CH]1CC[CH]5=[CH]6CC4)(c1ccccc1)c1ccccc1)[Si](C)(C)C)[CH2]=[CH]2C3
• Title of publication: Bimetallic, Spirocyclic, Methylene-Bridged Carbene Complexes of Rhodium and Palladium Derived by Stepwise Metalations of Lithiated Bis(diphenylphosphoranotrimethylsilylimido)methandiide
• Authors of publication: Fang, Min; Jones, Nathan D.; Friesen, Kristina; Lin, Guanyang; Ferguson, Michael J.; McDonald, Robert; Lukowski, Robert; Cavell, Ronald G.
• Journal of publication: Organometallics
• Year of publication: 2009
• Journal volume: 28
• Journal issue: 6
• Pages of publication: 1652
• a: 12.9028 ± 0.001 Å
• b: 14.9328 ± 0.0012 Å
• c: 21.9198 ± 0.0018 Å
• α: 90°
• β: 99.137 ± 0.001°
• γ: 90°
• Cell volume: 4169.8 ± 0.6 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0505
• Residual factor for significantly intense reflections: 0.0313
• Weighted residual factors for significantly intense reflections: 0.0669
• Weighted residual factors for all reflections included in the refinement: 0.0736
• Goodness-of-fit parameter for all reflections included in the refinement: 1.032
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No