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Information card for entry 4068864
Preview
| Coordinates | 4068864.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H52 Mn2 O2 Si4 |
|---|---|
| Calculated formula | C20 H52 Mn2 O2 Si4 |
| Title of publication | Bis[(trimethylsilyl)methyl]manganese: Structural Variations of Its Solvent-Free and TMEDA-, Pyridine-, and Dioxane-Complexed Forms |
| Authors of publication | Alberola, Antonio; Blair, Victoria L.; Carrella, Luca M.; Clegg, William; Kennedy, Alan R.; Klett, Jan; Mulvey, Robert E.; Newton, Sean; Rentschler, Eva; Russo, Luca |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 7 |
| Pages of publication | 2112 |
| a | 8.2431 ± 0.001 Å |
| b | 10.6831 ± 0.0018 Å |
| c | 20.141 ± 0.003 Å |
| α | 82.895 ± 0.016° |
| β | 88.064 ± 0.015° |
| γ | 67.505 ± 0.012° |
| Cell volume | 1625.9 ± 0.4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.059 |
| Residual factor for significantly intense reflections | 0.0327 |
| Weighted residual factors for significantly intense reflections | 0.0616 |
| Weighted residual factors for all reflections included in the refinement | 0.0695 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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