Information card for entry 4068876

Structure parameters

• Formula: C52 H58 N2 O2 Si W
• Calculated formula: C52 H46 N2 O2 Si W
• SMILES: [W]1234([Si](c5ccc(cc5)C)(c5ccc(cc5)C)c5ccc(cc5)C)([n]5ccc(N(C)C)cc5)(C#[O])(C#[O])[c]5([c]1([c]2([c]3([c]45C)C)C)C)C.c1ccccc1.c1ccccc1
• Title of publication: Synthesis and Characterization of DMAP-Stabilized Aryl(silylene) Complexes and (Arylsilyl)(DMAP) Complexes of Tungsten: Mechanistic Study on the Interconversion between These Complexes via 1,2-Aryl Migration
• Authors of publication: Suzuki, Eiji; Komuro, Takashi; Okazaki, Masaaki; Tobita, Hiromi
• Journal of publication: Organometallics
• Year of publication: 2009
• Journal volume: 28
• Journal issue: 6
• Pages of publication: 1791
• a: 11.2137 ± 0.0002 Å
• b: 12.3983 ± 0.0002 Å
• c: 18.919 ± 0.0009 Å
• α: 89.241 ± 0.0013°
• β: 75.759 ± 0.0007°
• γ: 65.4601 ± 0.0013°
• Cell volume: 2307.38 ± 0.13 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0569
• Residual factor for significantly intense reflections: 0.0511
• Weighted residual factors for significantly intense reflections: 0.1333
• Weighted residual factors for all reflections included in the refinement: 0.142
• Goodness-of-fit parameter for all reflections included in the refinement: 1.152
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No