Information card for entry 4068975

Structure parameters

• Formula: C34 H52 N Ni O0.5 P2 Si
• Calculated formula: C34 H52 N Ni O0.5 P2 Si
• Title of publication: Mild Protocol for the Synthesis of Stable Nickel Complexes Having Primary and Secondary Silyl Ligands
• Authors of publication: Adhikari, Debashis; Pink, Maren; Mindiola, Daniel J.
• Journal of publication: Organometallics
• Year of publication: 2009
• Journal volume: 28
• Journal issue: 7
• Pages of publication: 2072
• a: 10.0074 ± 0.0007 Å
• b: 10.0249 ± 0.0007 Å
• c: 17.2061 ± 0.0012 Å
• α: 84.918 ± 0.001°
• β: 77.723 ± 0.001°
• γ: 83.292 ± 0.001°
• Cell volume: 1671.5 ± 0.2 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0349
• Residual factor for significantly intense reflections: 0.0312
• Weighted residual factors for significantly intense reflections: 0.0824
• Weighted residual factors for all reflections included in the refinement: 0.0846
• Goodness-of-fit parameter for all reflections included in the refinement: 1.05
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No