Information card for entry 4069395

Structure parameters

• Formula: C18 H40 N2 S2 Si4 Sn2
• Calculated formula: C18 H40 N2 S2 Si4 Sn2
• SMILES: [Sn]1([S]2[Sn]([S]1c1c2cccc1)N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C
• Title of publication: N,S- and N,O-Substituted Stannylenes: Preparation and X-ray Diffraction Studies
• Authors of publication: Zabula, Alexander V.; Pape, Tania; Hupka, Florian; Hepp, Alexander; Hahn, F. Ekkehardt
• Journal of publication: Organometallics
• Year of publication: 2009
• Journal volume: 28
• Journal issue: 14
• Pages of publication: 4221
• a: 13.3768 ± 0.0004 Å
• b: 16.0331 ± 0.0005 Å
• c: 13.867 ± 0.0004 Å
• α: 90 ± 0.0004°
• β: 91.463 ± 0.0004°
• γ: 90 ± 0.0004°
• Cell volume: 2973.11 ± 0.15 ų
• Cell temperature: 153 ± 1 K
• Ambient diffraction temperature: 153 ± 1 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0193
• Residual factor for significantly intense reflections: 0.016
• Weighted residual factors for significantly intense reflections: 0.0381
• Weighted residual factors for all reflections included in the refinement: 0.0393
• Goodness-of-fit parameter for all reflections included in the refinement: 1.024
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No