Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4069426
Preview
| Coordinates | 4069426.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C64 H86 O5 Sn2 Te2 |
|---|---|
| Calculated formula | C64 H86 O5 Sn2 Te2 |
| SMILES | O1[Sn]2(O[Te](c3c(c4c(C)cc(cc4C)C)cccc3c3c(cc(cc3C)C)C)O[Sn](C(C)(C)C)(C(C)(C)C)(O2)O[Te]1c1c(cccc1c1c(C)cc(C)cc1C)c1c(C)cc(cc1C)C)(C(C)(C)C)C(C)(C)C |
| Title of publication | Molecular Stannatelluroxanes |
| Authors of publication | Beckmann, Jens; Bolsinger, Jens; Hesse, Malte |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 14 |
| Pages of publication | 4225 |
| a | 21.52 ± 0.01 Å |
| b | 21.417 ± 0.005 Å |
| c | 29.85 ± 0.012 Å |
| α | 90° |
| β | 96.22 ± 0.04° |
| γ | 90° |
| Cell volume | 13677 ± 9 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1949 |
| Residual factor for significantly intense reflections | 0.057 |
| Weighted residual factors for significantly intense reflections | 0.0911 |
| Weighted residual factors for all reflections included in the refinement | 0.1149 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.958 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4069426.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.