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Information card for entry 4070266
Preview
Coordinates | 4070266.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H116 Cr2 N6 P4 Si2 |
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Calculated formula | C58 H116 Cr2 N6 P4 Si2 |
SMILES | [Cr]123([Cr]4(N(C(C)(C)C)[Si]([N]4(CCP(C(C)C)C(C)C)CCP(C(C)C)C(C)C)(C)C)(N1c1ccc(cc1)C)N2c1ccc(cc1)C)N(C(C)(C)C)[Si]([N]3(CCP(C(C)C)C(C)C)CCP(C(C)C)C(C)C)(C)C |
Title of publication | Chromium Complexes Supported by the Multidentate Monoanionic N2P2Ligand: Reduction Chemistry and Reactivity with Ethylene |
Authors of publication | Rozenel, Sergio S.; Chomitz, Wayne A.; Arnold, John |
Journal of publication | Organometallics |
Year of publication | 2009 |
Journal volume | 28 |
Journal issue | 21 |
Pages of publication | 6243 |
a | 13.174 ± 0.003 Å |
b | 15.113 ± 0.003 Å |
c | 17.002 ± 0.004 Å |
α | 89.222 ± 0.003° |
β | 88.345 ± 0.003° |
γ | 84.857 ± 0.003° |
Cell volume | 3369.8 ± 1.3 Å3 |
Cell temperature | 171 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0877 |
Residual factor for significantly intense reflections | 0.0444 |
Weighted residual factors for significantly intense reflections | 0.0933 |
Weighted residual factors for all reflections included in the refinement | 0.0998 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4070266.html
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