Information card for entry 4070514

Structure parameters

• Formula: C41 H32 O4 P2 Ru2 Te2
• Calculated formula: C41 H32 O4 P2 Ru2 Te2
• SMILES: [Te]1([Ru]23([Te]([Ru]12([P](c1ccccc1)(C[P]3(c1ccccc1)c1ccccc1)c1ccccc1)(C#[O])C#[O])c1ccccc1)(C#[O])C#[O])c1ccccc1
• Title of publication: Facile E−E and E−C Bond Activation of PhEEPh (E = Te, Se, S) by Ruthenium Carbonyl Clusters: Formation of Di- and Triruthenium Complexes Bearing Bridging dppm and Phenylchalcogenide and Capping Chalcogenido Ligands
• Authors of publication: Begum, Noorjahan; Hyder, Md. Iqbal; Hassan, Mohammad R.; Kabir, Shariff E.; Bennett, Dennis W.; Haworth, Daniel T.; Siddiquee, Tasneem A.; Rokhsana, Dalia; Sharmin, Ayesha; Rosenberg, Edward
• Journal of publication: Organometallics
• Year of publication: 2008
• Journal volume: 27
• Journal issue: 7
• Pages of publication: 1550
• a: 11.015 ± 0.005 Å
• b: 18.542 ± 0.005 Å
• c: 19.843 ± 0.005 Å
• α: 90 ± 0.005°
• β: 92.34 ± 0.005°
• γ: 90 ± 0.005°
• Cell volume: 4049 ± 2 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0492
• Residual factor for significantly intense reflections: 0.0379
• Weighted residual factors for significantly intense reflections: 0.0941
• Weighted residual factors for all reflections included in the refinement: 0.102
• Goodness-of-fit parameter for all reflections included in the refinement: 0.934
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No