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Information card for entry 4070564
Preview
| Coordinates | 4070564.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Arene-Y(CH2SiMe3)2.THF |
|---|---|
| Formula | C32 H47 O Si2 Y |
| Calculated formula | C32 H47 O Si2 Y |
| SMILES | [c]12([c]3([c]4([c]56[c]1(c1ccccc1c1ccccc51)[Y]2346(C[Si](C)(C)C)(C[Si](C)(C)C)[O]1CCCC1)C)C)C |
| Title of publication | Yttrium Complexes of a Phenanthrene-Fused Cyclopentadienyl: Synthetic, Structural, and Reactivity Studies |
| Authors of publication | Sun, Jianlong; Berg, David J.; Twamley, Brendan |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 4 |
| Pages of publication | 683 |
| a | 11.1359 ± 0.0005 Å |
| b | 12.7246 ± 0.0006 Å |
| c | 12.9267 ± 0.0006 Å |
| α | 76.003 ± 0.001° |
| β | 74.189 ± 0.001° |
| γ | 64.557 ± 0.001° |
| Cell volume | 1574.97 ± 0.13 Å3 |
| Cell temperature | 86 ± 2 K |
| Ambient diffraction temperature | 86 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.035 |
| Residual factor for significantly intense reflections | 0.0305 |
| Weighted residual factors for significantly intense reflections | 0.075 |
| Weighted residual factors for all reflections included in the refinement | 0.077 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.