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Information card for entry 4070625
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Jmol._Canvas2D (Jmol) "jmolApplet0"[x]
Coordinates | 4070625.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H62 Fe Si2 |
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Calculated formula | C34 H62 Fe Si2 |
SMILES | [Fe]12345678([CH]9=[CH]1C2([Si](C(C)C)(C(C)C)C(C)C)[CH]3=[CH]4C9(C)C)[CH]1=[CH]5C6([Si](C(C)C)(C(C)C)C(C)C)[CH]7=[CH]8C1(C)C |
Title of publication | Synthetic, Structural, and Electrochemical Studies of Edge-Bridged Open Ferrocenes |
Authors of publication | Chong, Daesung; Geiger, William E.; Davis, Nathan A.; Weisbrich, Anke; Shi, Yifan; Arif, Atta M.; Ernst, Richard D. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 3 |
Pages of publication | 430 |
a | 9.9956 ± 0.0002 Å |
b | 11.2121 ± 0.0003 Å |
c | 17.1629 ± 0.0004 Å |
α | 94.629 ± 0.001° |
β | 95.3399 ± 0.0013° |
γ | 115.613 ± 0.0013° |
Cell volume | 1711.2 ± 0.07 Å3 |
Cell temperature | 150 ± 1 K |
Ambient diffraction temperature | 150 ± 1 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0523 |
Residual factor for significantly intense reflections | 0.0407 |
Weighted residual factors for significantly intense reflections | 0.0972 |
Weighted residual factors for all reflections included in the refinement | 0.1058 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4070625.html
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