Information card for entry 4071176

Structure parameters

• Formula: C55 H50 P2 Pt Si
• Calculated formula: C55 H50 P2 Pt Si
• SMILES: c1(ccccc1)[P](c1ccccc1)(c1ccccc1)[PtH]([P](c1ccccc1)(c1ccccc1)c1ccccc1)[SiH](c1ccccc1)c1ccccc1.c1(ccccc1)C
• Title of publication: Spectroscopic and Structural Studies of Thermally Unstable Intermediates Generated in the Reaction of [Pt(PPh3)2(η2-C2H4)] with Dihydrodisilanes
• Authors of publication: Arii, Hidekazu; Takahashi, Makiko; Noda, Aki; Nanjo, Masato; Mochida, Kunio
• Journal of publication: Organometallics
• Year of publication: 2008
• Journal volume: 27
• Journal issue: 8
• Pages of publication: 1929
• a: 9.5937 ± 0.0002 Å
• b: 11.1677 ± 0.0002 Å
• c: 21.3492 ± 0.0003 Å
• α: 97.04 ± 0.001°
• β: 94.1 ± 0.001°
• γ: 98.436 ± 0.001°
• Cell volume: 2236.19 ± 0.07 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0634
• Residual factor for significantly intense reflections: 0.0504
• Weighted residual factors for significantly intense reflections: 0.1127
• Weighted residual factors for all reflections included in the refinement: 0.1211
• Goodness-of-fit parameter for all reflections included in the refinement: 1.051
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No