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Information card for entry 4071216
Preview
| Coordinates | 4071216.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H56 Si4 Zr |
|---|---|
| Calculated formula | C42 H56 Si4 Zr |
| SMILES | [cH]12[cH]3[cH]4[cH]5[cH]1[Zr]167892345(C(=C(C(=C1[Si](C)(C)[Si](C)(C)C)c1ccccc1)c1ccccc1)[Si](C)(C)[Si](C)(C)C)[cH]1[cH]6[cH]7[cH]8[cH]91.c1ccccc1 |
| Title of publication | Group 4 Metallocene Complexes of Tris(trimethylsilyl)silylacetylene and Related Alkynes |
| Authors of publication | Zirngast, Michaela; Marschner, Christoph; Baumgartner, Judith |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 11 |
| Pages of publication | 2570 |
| a | 19.608 ± 0.004 Å |
| b | 11.116 ± 0.002 Å |
| c | 19.047 ± 0.004 Å |
| α | 90° |
| β | 97.32 ± 0.03° |
| γ | 90° |
| Cell volume | 4117.7 ± 1.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1082 |
| Residual factor for significantly intense reflections | 0.0914 |
| Weighted residual factors for significantly intense reflections | 0.1708 |
| Weighted residual factors for all reflections included in the refinement | 0.1776 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.289 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4071216.html
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Users of the data should acknowledge the original authors of the
structural data.