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Information card for entry 4071278
Preview
| Coordinates | 4071278.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H38 Cl2 Si2 Ti |
|---|---|
| Calculated formula | C22 H38 Cl2 Si2 Ti |
| SMILES | [c]12([c]3([c]4([Ti]5678923([c]1([c]47C)C)(Cl)([c]1([c]5([c]6([c]8([c]91C)C)C)C)[SiH](C)C)Cl)C)C)[SiH](C)C |
| Title of publication | Reactivity of SiMe2H Substituents in Permethylated Titanocene Complexes: Dehydrocoupling and Ethene Hydrosilylation |
| Authors of publication | Horáček, Michal; Pinkas, Jiří; Gyepes, Róbert; Kubišta, Jiří; Mach, Karel |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 11 |
| Pages of publication | 2635 |
| a | 18.3852 ± 0.0011 Å |
| b | 8.1284 ± 0.0003 Å |
| c | 16.4522 ± 0.001 Å |
| α | 90° |
| β | 96.183 ± 0.002° |
| γ | 90° |
| Cell volume | 2444.4 ± 0.2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0527 |
| Residual factor for significantly intense reflections | 0.036 |
| Weighted residual factors for significantly intense reflections | 0.0745 |
| Weighted residual factors for all reflections included in the refinement | 0.0822 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4071278.html
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Users of the data should acknowledge the original authors of the
structural data.