Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4071296
Preview
Coordinates | 4071296.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C76 H108 N8 Ni O4 Sn4 |
---|---|
Calculated formula | C76 H108 N8 Ni O4 Sn4 |
SMILES | C1COCC1.C1OCCC1.[Sn]12N(c3c(N2Cc2cccc(CN4[Sn]([Ni]51[Sn]1(N(c6c(N1CC(C)(C)C)cccc6)Cc1cccc(c1)CN1[Sn]5N(c5ccccc15)CC(C)(C)C)[O]1CCCC1)N(c1ccccc41)CC(C)(C)C)c2)cccc3)CC(C)(C)C.O1CCCC1 |
Title of publication | Homoleptic Complexes of Bisstannylenes with Nickel(0): Synthesis, X-Ray Diffraction Studies, and119Sn NMR Investigations |
Authors of publication | Zabula, Alexander V.; Pape, Tania; Hepp, Alexander; Hahn, F. Ekkehardt |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 12 |
Pages of publication | 2756 |
a | 13.673 ± 0.004 Å |
b | 15.729 ± 0.004 Å |
c | 18.926 ± 0.005 Å |
α | 113.997 ± 0.005° |
β | 90.057 ± 0.005° |
γ | 94.065 ± 0.005° |
Cell volume | 3707.1 ± 1.7 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.11 |
Residual factor for significantly intense reflections | 0.0725 |
Weighted residual factors for significantly intense reflections | 0.172 |
Weighted residual factors for all reflections included in the refinement | 0.1922 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4071296.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.