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Information card for entry 4071487
Preview
Coordinates | 4071487.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H44 O5 P2 W |
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Calculated formula | C43 H44 O5 P2 W |
SMILES | [W]([P]1(P(C1=C(c1ccccc1)c1ccccc1)c1c(cc(cc1C(C)(C)C)C(C)(C)C)C(C)(C)C)c1ccccc1)(C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | Diastereoselective Formation of Complexed Methylenediphosphiranes |
Authors of publication | Jansen, Helen; Rosenthal, Amos J.; Slootweg, J. Chris; Ehlers, Andreas W.; Lutz, Martin; Spek, Anthony L.; Lammertsma, Koop |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 12 |
Pages of publication | 2868 |
a | 11.3216 ± 0.0004 Å |
b | 13.2755 ± 0.0004 Å |
c | 14.5331 ± 0.0003 Å |
α | 70.009 ± 0.001° |
β | 78.96 ± 0.002° |
γ | 75.101 ± 0.001° |
Cell volume | 1970.75 ± 0.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0181 |
Residual factor for significantly intense reflections | 0.0149 |
Weighted residual factors for significantly intense reflections | 0.0317 |
Weighted residual factors for all reflections included in the refinement | 0.0324 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.092 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4071487.html
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Users of the data should acknowledge the original authors of the
structural data.