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Information card for entry 4071664
Preview
Coordinates | 4071664.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H60 N4 Si4 Sr |
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Calculated formula | C33 H60 N4 Si4 Sr |
SMILES | C[Si](C)(C)N([Sr](N([Si](C)(C)C)[Si](C)(C)C)=C1N(C=CN1c1c(C)cc(C)cc1C)c1c(C)cc(cc1C)C)[Si](C)(C)C |
Title of publication | Synthesis, Characterization, and Solution Lability of N-Heterocyclic Carbene Adducts of the Heavier Group 2 Bis(trimethylsilyl)amides |
Authors of publication | Barrett, Anthony G. M.; Crimmin, Mark R.; Hill, Michael S.; Kociok-Köhn, Gabriele; MacDougall, Dugald J.; Mahon, Mary F.; Procopiou, Panayiotis A. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 15 |
Pages of publication | 3939 |
a | 17.329 ± 0.0003 Å |
b | 14.036 ± 0.0002 Å |
c | 17.148 ± 0.0003 Å |
α | 90° |
β | 97.187 ± 0.0007° |
γ | 90° |
Cell volume | 4138.14 ± 0.12 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.043 |
Residual factor for significantly intense reflections | 0.0344 |
Weighted residual factors for significantly intense reflections | 0.0836 |
Weighted residual factors for all reflections included in the refinement | 0.0885 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4071664.html
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