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Information card for entry 4071668
Preview
| Coordinates | 4071668.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H46 O Si Ti |
|---|---|
| Calculated formula | C31 H46 O Si Ti |
| SMILES | C(=C\[Si](C)(C)C)(c1ccccc1)/[Ti]12345678([c]9([c]1([c]2([c]3([c]49C)C)C)C)C)([c]1([c]8([c]7([c]6([c]51C)C)C)C)C)O |
| Title of publication | Synthesis and Reactions of Cp*2Hf(η2-PhC2SiMe3) with Water and Carbon Dioxide† |
| Authors of publication | Beweries, Torsten; Burlakov, Vladimir V.; Peitz, Stephan; Arndt, Perdita; Baumann, Wolfgang; Spannenberg, Anke; Rosenthal, Uwe |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 15 |
| Pages of publication | 3954 |
| a | 9.1336 ± 0.0004 Å |
| b | 10.3287 ± 0.0004 Å |
| c | 16.5723 ± 0.0007 Å |
| α | 93.569 ± 0.003° |
| β | 104.347 ± 0.003° |
| γ | 107.04 ± 0.003° |
| Cell volume | 1432.72 ± 0.11 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.041 |
| Residual factor for significantly intense reflections | 0.031 |
| Weighted residual factors for significantly intense reflections | 0.0841 |
| Weighted residual factors for all reflections included in the refinement | 0.0864 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.958 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4071668.html
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Users of the data should acknowledge the original authors of the
structural data.