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Information card for entry 4071673
Preview
Coordinates | 4071673.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C68 H15 Mo N O3 S2 |
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Calculated formula | C68 H15 Mo N O3 S2 |
SMILES | [Mo]1234(N=O)([c]56[c]71[c]12[c]23[c]45C3(c4c5C2(c2c8C1(c1c9C7(c7c%10C6(c6c3c3c4c4c%11c5c2c2c5c8c1c1c8c9c7c7c9c%10c6c6c3c3c4c4c%11c2c2c5c1c1c8c7c5c9c6c3c3c5c1c2c43)C)C)C)C)C)(C#[O])C#[O].C(=S)=S |
Title of publication | Group 6 Metal Complexes of the η5-Pentamethyl[60]fullerene |
Authors of publication | Matsuo, Yutaka; Iwashita, Akihiko; Nakamura, Eiichi |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 18 |
Pages of publication | 4611 |
a | 27.28 ± 0.004 Å |
b | 14.993 ± 0.001 Å |
c | 19.193 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7850.1 ± 1.8 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 56 |
Hermann-Mauguin space group symbol | P c c n |
Hall space group symbol | -P 2ab 2ac |
Residual factor for all reflections | 0.1773 |
Residual factor for significantly intense reflections | 0.1567 |
Weighted residual factors for significantly intense reflections | 0.4176 |
Weighted residual factors for all reflections included in the refinement | 0.4396 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.769 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4071673.html
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Users of the data should acknowledge the original authors of the
structural data.