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Information card for entry 4071675
Preview
Coordinates | 4071675.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | MoC60Me5O2Br |
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Formula | C65 H15 Br Mo O2 |
Calculated formula | C65 H15 Br Mo O2 |
SMILES | [Mo]1234(Br)(=O)(=O)[c]56[c]71[c]12[c]23[c]45C3(c4c5C2(c2c8C1(c1c9C7(c7c%10C6(c6c3c3c4c4c%11c5c2c2c5c8c1c1c8c9c7c7c9c%10c6c6c3c3c4c4c%11c2c2c5c1c1c8c7c5c9c6c3c3c5c1c2c43)C)C)C)C)C |
Title of publication | Group 6 Metal Complexes of the η5-Pentamethyl[60]fullerene |
Authors of publication | Matsuo, Yutaka; Iwashita, Akihiko; Nakamura, Eiichi |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 18 |
Pages of publication | 4611 |
a | 37.595 ± 0.003 Å |
b | 9.918 ± 0.0008 Å |
c | 21.144 ± 0.0014 Å |
α | 90° |
β | 112.16 ± 0.005° |
γ | 90° |
Cell volume | 7301.6 ± 1 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0952 |
Residual factor for significantly intense reflections | 0.0686 |
Weighted residual factors for significantly intense reflections | 0.1841 |
Weighted residual factors for all reflections included in the refinement | 0.2075 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4071675.html
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Users of the data should acknowledge the original authors of the
structural data.