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Information card for entry 4071754
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Coordinates | 4071754.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | organotin nitrate |
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Formula | C28 H29 N7 O10 Sn2 |
Calculated formula | C28 H29 N7 O10 Sn2 |
SMILES | [OH]([Sn]1(ON(=O)=O)([n]2c3c(ccc4ccc[n]1c34)ccc2)(C)C)[Sn]1([n]2c3c(ccc4c3[n]1ccc4)ccc2)(ON(=O)=O)(C)C.O=N(=O)[O-] |
Title of publication | Trapping a Discrete [R2Sn(μ-OH)SnR2] Motif. Synthesis and Structural Characterization of [{(Phen)(NO3)Me2Sn(μ-OH)SnMe2(NO3)(Phen)}{NO3}] (Phen = 1,10-Phenanthroline) |
Authors of publication | Chandrasekhar, Vadapalli; Singh, Puja |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 16 |
Pages of publication | 4083 |
a | 11.0753 ± 0.0007 Å |
b | 12.0391 ± 0.0008 Å |
c | 12.0906 ± 0.0008 Å |
α | 90.121 ± 0.001° |
β | 98.385 ± 0.001° |
γ | 101.599 ± 0.001° |
Cell volume | 1561.5 ± 0.18 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0258 |
Residual factor for significantly intense reflections | 0.0242 |
Weighted residual factors for significantly intense reflections | 0.0624 |
Weighted residual factors for all reflections included in the refinement | 0.0665 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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