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Information card for entry 4072142
Preview
Coordinates | 4072142.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H32 P2 Pt S2 Si |
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Calculated formula | C28 H32 P2 Pt S2 Si |
SMILES | c1(ccccc1)[P](C)(C)[Pt]1(S[Si](c2ccccc2)(c2ccccc2)S1)[P](c1ccccc1)(C)C |
Title of publication | Reactivity of Bis(silyl)platinum(II) Complexes toward Organic Isothiocyanates: Preparation and Structures of (Dithiocarbonimidato)- and (Diphenylsilanedithiolato)platinum(II) Complexes,cis-[Pt(S2CNPh)L2] andcis-[Pt(S2SiPh2)L2] (L = PMe2Ph, PEt3; L-L = dppp) |
Authors of publication | Lee, Kyung-Eun; Chang, Xiaohong; Kim, Yong-Joo; Huh, Hyun Sue; Lee, Soon W. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 21 |
Pages of publication | 5566 |
a | 14.898 ± 0.002 Å |
b | 11.8386 ± 0.0009 Å |
c | 16.944 ± 0.004 Å |
α | 90° |
β | 106.882 ± 0.013° |
γ | 90° |
Cell volume | 2859.7 ± 0.8 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0262 |
Residual factor for significantly intense reflections | 0.0223 |
Weighted residual factors for significantly intense reflections | 0.0543 |
Weighted residual factors for all reflections included in the refinement | 0.0564 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4072142.html
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