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Information card for entry 4072237
Preview
Coordinates | 4072237.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H53 Cl Si Ti |
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Calculated formula | C34 H53 Cl Si Ti |
SMILES | [Ti]123456789(Cl)([c]%10([c]1([c]2([c]3([c]4%10C)C)C)C)CC(=C1[Si](C(C(C)(C)C)=C91)(C)C)C(C)(C)C)[C]1(=[C]8([C]7(=[C]6(C51C)C)C)C)C |
Title of publication | Insertion of Internal Alkynes and Ethene into Permethylated Singly Tucked-in Titanocene |
Authors of publication | Pinkas, J.; Císařová, I.; Gyepes, R.; Horáček, M.; Kubišta, J.; Čejka, J.; Gómez-Ruiz, S.; Hey-Hawkins, E.; Mach, K. |
Journal of publication | Organometallics |
Year of publication | 2008 |
Journal volume | 27 |
Journal issue | 21 |
Pages of publication | 5532 |
a | 31.7739 ± 0.0005 Å |
b | 20.4057 ± 0.0003 Å |
c | 11.187 ± 0.0001 Å |
α | 90° |
β | 109.552 ± 0.0009° |
γ | 90° |
Cell volume | 6835.04 ± 0.16 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0402 |
Residual factor for significantly intense reflections | 0.032 |
Weighted residual factors for significantly intense reflections | 0.0858 |
Weighted residual factors for all reflections included in the refinement | 0.0903 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4072237.html
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Users of the data should acknowledge the original authors of the
structural data.