Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4072405
Preview
| Coordinates | 4072405.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | compound 4a (L-585-1, 978) |
|---|---|
| Formula | C27 H36 B Ir N6 O |
| Calculated formula | C27 H36 B Ir N6 O |
| SMILES | [Ir]123([n]4n([BH](n5[n]1c(cc5C)C)n1[n]2c(cc1C)C)c(cc4C)C)(=C(OCC)C=CC3)c1ccccc1 |
| Title of publication | Generation of Metallacyclic Structures from the Reactions of Vinyl Ethers with a TpMe2IrIIICompound |
| Authors of publication | Paneque, Margarita; Poveda, Manuel L.; Santos, Laura L.; Carmona, Ernesto; Mereiter, Kurt |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 23 |
| Pages of publication | 6353 |
| a | 8.0575 ± 0.0004 Å |
| b | 20.3891 ± 0.0011 Å |
| c | 16.4221 ± 0.0009 Å |
| α | 90° |
| β | 104.086 ± 0.001° |
| γ | 90° |
| Cell volume | 2616.8 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0251 |
| Residual factor for significantly intense reflections | 0.0217 |
| Weighted residual factors for significantly intense reflections | 0.0442 |
| Weighted residual factors for all reflections included in the refinement | 0.0452 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.126 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4072405.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.