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Information card for entry 4073449
Preview
Coordinates | 4073449.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H51 Ir O P2 Si2 |
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Calculated formula | C48 H51 Ir O P2 Si2 |
SMILES | [Ir]12([P](c3ccccc3)(c3ccccc3)c3ccccc3)([P](c3ccccc3)(c3ccccc3)c3ccccc3)([C]3([Si](C)(C)C)=[C]1([Si](C)(C)C)C3C=C2)C#[O] |
Title of publication | Rearrangement of Iridabenzvalenes to Iridabenzenes and/or η5-Cyclopentadienyliridium(I) Complexes: Experimental and Computational Analysis of the Influence of Silyl Ring Substituents and Phosphine Ligands§ |
Authors of publication | Wu, He-Ping; Ess, Daniel H.; Lanza, Seren; Weakley, Timothy J. R.; Houk, K. N.; Baldridge, Kim K.; Haley, Michael M. |
Journal of publication | Organometallics |
Year of publication | 2007 |
Journal volume | 26 |
Journal issue | 16 |
Pages of publication | 3957 |
a | 11.958 ± 0.003 Å |
b | 13.111 ± 0.0014 Å |
c | 14.535 ± 0.004 Å |
α | 95.282 ± 0.017° |
β | 102.43 ± 0.02° |
γ | 95.649 ± 0.013° |
Cell volume | 2199.5 ± 0.9 Å3 |
Cell temperature | 296 K |
Ambient diffraction temperature | 296 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.058 |
Residual factor for significantly intense reflections | 0.033 |
Weighted residual factors for all reflections | 0.078 |
Weighted residual factors for all reflections included in the refinement | 0.038 |
Goodness-of-fit parameter for all reflections | 1.58 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.59 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4073449.html
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Users of the data should acknowledge the original authors of the
structural data.