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Information card for entry 4073488
Preview
Coordinates | 4073488.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | UCI-KAM-5 |
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Formula | C27 H38 Se U |
Calculated formula | C27 H38 Se U |
SMILES | [c]12([c]3([c]4([c]5([c]1(C)[U]16782345([c]2([c]1([c]6([c]7([c]82C)C)C)C)C)(C)[Se]c1ccccc1)C)C)C)C |
Title of publication | Formation of (C5Me5)2U(EPh)Me, (C5Me5)2U(EPh)2, and (C5Me5)2U(η2-TeC6H4) from (C5Me5)2UMe2and PhEEPh (E = S, Se, Te) |
Authors of publication | Evans, William J.; Miller, Kevin A.; Ziller, Joseph W.; DiPasquale, Antonio G.; Heroux, Katie J.; Rheingold, Arnold L. |
Journal of publication | Organometallics |
Year of publication | 2007 |
Journal volume | 26 |
Journal issue | 17 |
Pages of publication | 4287 |
a | 8.909 ± 0.0015 Å |
b | 17.166 ± 0.003 Å |
c | 16.484 ± 0.003 Å |
α | 90° |
β | 100.332 ± 0.002° |
γ | 90° |
Cell volume | 2480.1 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0423 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for significantly intense reflections | 0.0757 |
Weighted residual factors for all reflections included in the refinement | 0.0794 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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