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Information card for entry 4073691
Preview
Coordinates | 4073691.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H42 Cl13 N8 Ru2 Si |
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Calculated formula | C53 H42 Cl13 N8 Ru2 Si |
SMILES | [Ru]1234[Ru](Cl)([N](=C(N1C)c1ccc(cc1)/C=C/[Si](C)(C)C)C)(N(C=[N]2c1cc(Cl)cc(Cl)c1)c1cc(Cl)cc(Cl)c1)(N(C=[N]3c1cc(Cl)cc(Cl)c1)c1cc(Cl)cc(Cl)c1)N(C=[N]4c1cc(Cl)cc(Cl)c1)c1cc(Cl)cc(Cl)c1 |
Title of publication | Peripheral Functionalization of Diruthenium Compounds via Heck Reactions |
Authors of publication | Chen, Wei-Zhong; Fanwick, Phillip E.; Ren, Tong |
Journal of publication | Organometallics |
Year of publication | 2007 |
Journal volume | 26 |
Journal issue | 17 |
Pages of publication | 4115 |
a | 11.5742 ± 0.0007 Å |
b | 13.7446 ± 0.0008 Å |
c | 22.3166 ± 0.0011 Å |
α | 86.287 ± 0.002° |
β | 82.449 ± 0.003° |
γ | 86.862 ± 0.004° |
Cell volume | 3508.2 ± 0.3 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.104 |
Residual factor for significantly intense reflections | 0.079 |
Weighted residual factors for significantly intense reflections | 0.215 |
Weighted residual factors for all reflections included in the refinement | 0.229 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.101 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MO-Kα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4073691.html
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