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Information card for entry 4073704
Preview
| Coordinates | 4073704.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H52 N P2 Rh |
|---|---|
| Calculated formula | C32 H52 N P2 Rh |
| SMILES | [Rh]123([CH2]=[CH]1C(C)(C)C)[P](c1c(ccc(c1)C)N3c1c(cc(cc1)C)[P]2(C(C)C)C(C)C)(C(C)C)C(C)C |
| Title of publication | Thioether, Dinitrogen, and Olefin Complexes of (PNP)Rh: Kinetics and Thermodynamics of Exchange and Oxidative Addition Reactions |
| Authors of publication | Gatard, Sylvain; Guo, Chengyun; Foxman, Bruce M.; Ozerov, Oleg V. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 25 |
| Pages of publication | 6066 |
| a | 9.688 ± 0.008 Å |
| b | 9.94 ± 0.003 Å |
| c | 19.119 ± 0.005 Å |
| α | 85.05 ± 0.02° |
| β | 81.31 ± 0.04° |
| γ | 62.22 ± 0.04° |
| Cell volume | 1610 ± 1.6 Å3 |
| Cell temperature | 294 K |
| Ambient diffraction temperature | 294 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0783 |
| Residual factor for significantly intense reflections | 0.0563 |
| Weighted residual factors for all reflections | 0.0988 |
| Weighted residual factors for significantly intense reflections | 0.0661 |
| Weighted residual factors for all reflections included in the refinement | 0.0661 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0724 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073704.html
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Users of the data should acknowledge the original authors of the
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