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Information card for entry 4074154
Preview
Coordinates | 4074154.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C50 H45 Cl2 O11 P2 Rh S |
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Calculated formula | C50 H45 Cl2 O11 P2 Rh S |
SMILES | [c]12([cH]3[cH]4[c]5([cH]6[cH]1[Rh]23456([P](Oc1ccccc1)(Oc1ccccc1)Oc1ccccc1)[P](Oc1ccccc1)(Oc1ccccc1)Oc1ccccc1)O)O.c1(ccc(cc1)C)S(=O)(=O)[O-].C(Cl)Cl |
Title of publication | Charge-Assisted Hydrogen Bonding and Other Noncovalent Interactions in the Self-Assembly of the Organometallic Building Block [(η6-hydroquinone)Rh(P(OPh)3)2]+with a Range of Counteranions |
Authors of publication | Son, Seung Uk; Reingold, Jeffrey A.; Carpenter, Gene B.; Czech, Paul T.; Sweigart, Dwight A. |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 22 |
Pages of publication | 5276 |
a | 11.875 ± 0.003 Å |
b | 17.555 ± 0.005 Å |
c | 24.061 ± 0.007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5016 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.296 |
Residual factor for significantly intense reflections | 0.078 |
Weighted residual factors for significantly intense reflections | 0.1451 |
Weighted residual factors for all reflections included in the refinement | 0.2147 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.93 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4074154.html
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Users of the data should acknowledge the original authors of the
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