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Information card for entry 4074218
Preview
Coordinates | 4074218.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H52 B2 N2 P2 Pt V |
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Calculated formula | C28 H52 B2 N2 P2 Pt V |
SMILES | [Pt]1(B([c]23[V]456789%10%11%12([cH]([cH]2%10)[cH]5[cH]3%11)[CH]2=[CH]4[CH]7=[CH]8[CH]6=[CH]%12C92B1N(C)C)N(C)C)([P](CC)(CC)CC)[P](CC)(CC)CC |
Title of publication | Facile Syntheses of Trovacene, the Formation of [n]Boratrovacenophanes (n= 1, 2), and Their Reactivity toward [Pt(PEt3)4] |
Authors of publication | Braunschweig, Holger; Lutz, Matthias; Radacki, Krzysztof; Schaumlöffel, Anu; Seeler, Fabian; Unkelbach, Christian |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 19 |
Pages of publication | 4433 |
a | 8.5651 ± 0.0001 Å |
b | 17.6564 ± 0.0003 Å |
c | 21.235 ± 0.0004 Å |
α | 90° |
β | 91.24 ± 0.001° |
γ | 90° |
Cell volume | 3210.59 ± 0.09 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0205 |
Residual factor for significantly intense reflections | 0.0197 |
Weighted residual factors for significantly intense reflections | 0.0501 |
Weighted residual factors for all reflections included in the refinement | 0.0505 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.128 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4074218.html
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Users of the data should acknowledge the original authors of the
structural data.