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Information card for entry 4074592
Preview
Coordinates | 4074592.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 1,4-disilabenzene dianion |
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Formula | C38 H78 Li2 O2 Si4 |
Calculated formula | C38 H78 Li2 O2 Si4 |
SMILES | [Si]123([C]4(=[C]5([Si]6([Li]245[O]2CCCC2)([C]2(=[C]1(CC)[Li]362[O]1CCCC1)CC)[Si](C)(C(C)(C)C)C(C)(C)C)CC)CC)[Si](C)(C(C)(C)C)C(C)(C)C |
Title of publication | Dilithium 1,4-Disilacyclohexa-2,5-diene-1,4-diide by the Reduction of 1,4-Disilabicyclo[2.2.0]hexa-2,5-diene: Synthesis and Characterization |
Authors of publication | Nakata, Norio; Oikawa, Toru; Matsumoto, Takeshi; Kabe, Yoshio; Sekiguchi, Akira |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 25 |
Pages of publication | 5850 |
a | 10.809 ± 0.0002 Å |
b | 18.543 ± 0.0007 Å |
c | 22.735 ± 0.0008 Å |
α | 90° |
β | 97.814 ± 0.0002° |
γ | 90° |
Cell volume | 4514.5 ± 0.2 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0539 |
Residual factor for significantly intense reflections | 0.0499 |
Weighted residual factors for significantly intense reflections | 0.1343 |
Weighted residual factors for all reflections included in the refinement | 0.1382 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.