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Information card for entry 4074864
Preview
Coordinates | 4074864.cif |
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Original paper (by DOI) | HTML |
Formula | C40 H39 N Ni P2 Si |
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Calculated formula | C40 H39 N Ni P2 Si |
SMILES | [Ni]12([P](c3ccccc3)(c3ccccc3)c3ccccc3N2c2ccccc2[P]1(c1ccccc1)c1ccccc1)C[Si](C)(C)C |
Title of publication | Amido Pincer Complexes of Nickel(II): Synthesis, Structure, and Reactivity |
Authors of publication | Liang, Lan-Chang; Chien, Pin-Shu; Lin, Jia-Ming; Huang, Mei-Hui; Huang, Yu-Lun; Liao, Ju-Hsiou |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 6 |
Pages of publication | 1399 - 1411 |
a | 10.9794 ± 0.0002 Å |
b | 15.7917 ± 0.0004 Å |
c | 20.8066 ± 0.0004 Å |
α | 96.604 ± 0.002° |
β | 94.5042 ± 0.0014° |
γ | 90.539 ± 0.0008° |
Cell volume | 3571.9 ± 0.13 Å3 |
Cell temperature | 298 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.15 |
Residual factor for significantly intense reflections | 0.067 |
Weighted residual factors for all reflections | 0.197 |
Weighted residual factors for significantly intense reflections | 0.162 |
Weighted residual factors for all reflections included in the refinement | 0.162 |
Goodness-of-fit parameter for all reflections | 2.854 |
Goodness-of-fit parameter for significantly intense reflections | 3.008 |
Goodness-of-fit parameter for all reflections included in the refinement | 2.962 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4074864.html
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Users of the data should acknowledge the original authors of the
structural data.