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Information card for entry 4074877
Preview
Coordinates | 4074877.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26.5 H33 B N6 O2 Ru |
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Calculated formula | C18 H17 B N6 O2 Ru |
SMILES | [Ru]12([n]3n([BH](n4[n]1ccc4)n1[n]2ccc1)ccc3)(C#[O])(C#[O])c1ccc(cc1)C |
Title of publication | Reactions of a Ru(II) Phenyl Complex with Substrates that Possess C‒N or C‒O Multiple Bonds: C‒C Bond Formation, N‒H Bond Cleavage, and Decarbonylation Reactions |
Authors of publication | Lee, John P.; Pittard, Karl A.; DeYonker, Nathan J.; Cundari, Thomas R.; Gunnoe, T. Brent; Petersen, Jeffrey L. |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 6 |
Pages of publication | 1500 - 1510 |
a | 7.5379 ± 0.0004 Å |
b | 11.8576 ± 0.0006 Å |
c | 15.3064 ± 0.0007 Å |
α | 79.215 ± 0.001° |
β | 78.105 ± 0.001° |
γ | 83.323 ± 0.001° |
Cell volume | 1310.78 ± 0.11 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0414 |
Residual factor for significantly intense reflections | 0.0366 |
Weighted residual factors for significantly intense reflections | 0.0945 |
Weighted residual factors for all reflections included in the refinement | 0.0968 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4074877.html
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Users of the data should acknowledge the original authors of the
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