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Information card for entry 4075001
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Coordinates | 4075001.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound2a |
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Chemical name | (2-trimethylsilylphenyl)diphenylmethylphosphonium iodide |
Formula | C22 H26 I P Si |
Calculated formula | C22 H26 I P Si |
SMILES | [P+](c1c([Si](C)(C)C)cccc1)(C)(c1ccccc1)c1ccccc1.[I-] |
Title of publication | Anionic 1,4-Silyl Migration in (2-(Trimethylsilyl)phenyl)phosphonium Methylides |
Authors of publication | Kawachi, Atsushi; Yoshioka, Takahiro; Yamamoto, Yohsuke |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 9 |
Pages of publication | 2390 |
a | 14.718 ± 0.0004 Å |
b | 11.526 ± 0.0004 Å |
c | 13.066 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2216.51 ± 0.13 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0317 |
Residual factor for significantly intense reflections | 0.0286 |
Weighted residual factors for significantly intense reflections | 0.0749 |
Weighted residual factors for all reflections included in the refinement | 0.0841 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.141 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4075001.html
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