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Information card for entry 4075010
Preview
Coordinates | 4075010.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H41 As2 O4 P Si2 W |
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Calculated formula | C32 H41 As2 O4 P Si2 W |
SMILES | [W]12345([P]6(OC(=[As]C6([Si](C)(C)C)[Si](C)(C)C)c6ccc(cc6)CC)OC(=[As]1)c1ccc(cc1)CC)(C#[O])(C#[O])[cH]1[cH]2[cH]3[cH]4[cH]51 |
Title of publication | Arsaalkenes R−AsC(NMe2)2[R = PhC(O), 4-EtC6H4C(O), 2,4,6-Me3C6H2C(O),tBuC(O), Me3Si]: Versatile Reagents in the Chemistry of Heterocumulenes |
Authors of publication | Weber, Lothar; Bayer, Philipp; Braun, Thomas; Stammler, Hans-Georg; Neumann, Beate |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 7 |
Pages of publication | 1786 |
a | 10.29 ± 0.0001 Å |
b | 13.589 ± 0.0002 Å |
c | 14.174 ± 0.0002 Å |
α | 96.876 ± 0.0008° |
β | 111.081 ± 0.0008° |
γ | 104.975 ± 0.0009° |
Cell volume | 1736.08 ± 0.04 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0229 |
Residual factor for significantly intense reflections | 0.0208 |
Weighted residual factors for significantly intense reflections | 0.0499 |
Weighted residual factors for all reflections included in the refinement | 0.0508 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4075010.html
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Users of the data should acknowledge the original authors of the
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