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Information card for entry 4075034
Preview
Coordinates | 4075034.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H33 N2 Ni P Si2 |
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Calculated formula | C21 H33 N2 Ni P Si2 |
SMILES | [Ni]123([N](=P(N1[Si](C)(C)C)(c1ccccc1)c1ccccc1)[Si](C)(C)C)[CH2]=[CH]2C3 |
Title of publication | Ethylene Polymerization Using Discrete Nickel(II) Iminophosphonamide Complexes |
Authors of publication | Stapleton, Russell L.; Chai, Jianfang; Taylor, Nicholas J.; Collins, Scott |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 10 |
Pages of publication | 2514 |
a | 14.6477 ± 0.0007 Å |
b | 9.5088 ± 0.0004 Å |
c | 18.5319 ± 0.0009 Å |
α | 90° |
β | 110.413 ± 0.001° |
γ | 90° |
Cell volume | 2419.07 ± 0.19 Å3 |
Cell temperature | 180 ± 1 K |
Ambient diffraction temperature | 180 ± 1 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0581 |
Residual factor for significantly intense reflections | 0.0488 |
Weighted residual factors for significantly intense reflections | 0.0871 |
Weighted residual factors for all reflections included in the refinement | 0.0888 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.821 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4075034.html
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