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Information card for entry 4075340
Preview
Coordinates | 4075340.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C90 H106 Cl2 O4 P4 Rh2 S2 |
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Calculated formula | C90 H106 Cl2 O4 P4 Rh2 S2 |
SMILES | c1c(ccc(c1)[S]1CC[P](c2ccccc2)(c2ccccc2)[Rh]1([P](CCOc1c(c(cc(c1C)C)C)C)(c1ccccc1)c1ccccc1)Cl)[S]1CC[P](c2ccccc2)(c2ccccc2)[Rh]1([P](CCOc1c(C)c(cc(c1C)C)C)(c1ccccc1)c1ccccc1)Cl.O(CC)CC.O(CC)CC |
Title of publication | Triple-Decker Complexes Formed via the Weak Link Approach. |
Authors of publication | Jeon, You-Moon; Heo, Jungseok; Brown, Aaron M.; Mirkin, Chad A. |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 11 |
Pages of publication | 2729 - 2732 |
a | 17.497 ± 0.005 Å |
b | 14.53 ± 0.004 Å |
c | 16.851 ± 0.005 Å |
α | 90° |
β | 104.004 ± 0.005° |
γ | 90° |
Cell volume | 4157 ± 2 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0803 |
Residual factor for significantly intense reflections | 0.0443 |
Weighted residual factors for significantly intense reflections | 0.1077 |
Weighted residual factors for all reflections included in the refinement | 0.1267 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.004 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4075340.html
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