Information card for entry 4075710

Structure parameters

• Formula: C26 H52 Mg N6 Si2
• Calculated formula: C26 H52 Mg N6 Si2
• SMILES: [Mg](N(C(C)C)[Si](C)(C)C)([n]1ccc(N(C)C)cc1)([n]1ccc(N(C)C)cc1)N([Si](C)(C)C)C(C)C
• Title of publication: Synthesis and Structural Characterization of Magnesium Amide Complexes Containing −N[(R)(SiMe3)] Ligands
• Authors of publication: Tang, Yongjun; Zakharov, Lev N.; Rheingold, Arnold L.; Kemp, Richard A.
• Journal of publication: Organometallics
• Year of publication: 2005
• Journal volume: 24
• Journal issue: 5
• Pages of publication: 836
• a: 31.064 ± 0.002 Å
• b: 11.9434 ± 0.0009 Å
• c: 17.9159 ± 0.0013 Å
• α: 90°
• β: 99.475 ± 0.001°
• γ: 90°
• Cell volume: 6556.3 ± 0.8 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0703
• Residual factor for significantly intense reflections: 0.0467
• Weighted residual factors for significantly intense reflections: 0.115
• Weighted residual factors for all reflections included in the refinement: 0.1268
• Goodness-of-fit parameter for all reflections included in the refinement: 1.009
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No