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Information card for entry 4075741
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Coordinates | 4075741.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 9 |
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Formula | C53 H44 B F15 Hf Si2 |
Calculated formula | C53.5 H40 B F15 Hf Si2 |
Title of publication | Synthesis, Ion Aggregation, Alkyl Bonding Modes, and Dynamics of 14-Electron Metallocenium Ion Pairs [(SBI)MCH2SiMe3+···X-] (M = Zr, Hf): Inner-Sphere (X = MeB(C6F5)3) versus Outer-Sphere (X = B(C6F5)4) Structures and the Implications for “Continuous” or “Intermittent” Alkene Polymerization Mechanisms |
Authors of publication | Song, Fuquan; Lancaster, Simon J.; Cannon, Roderick D.; Schormann, Mark; Humphrey, Simon M.; Zuccaccia, Cristiano; Macchioni, Alceo; Bochmann, Manfred |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1315 |
a | 12.1423 ± 0.0002 Å |
b | 13.8662 ± 0.0002 Å |
c | 17.0088 ± 0.0003 Å |
α | 106.059 ± 0.0006° |
β | 100.705 ± 0.0006° |
γ | 108.05 ± 0.0006° |
Cell volume | 2498.39 ± 0.07 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0582 |
Residual factor for significantly intense reflections | 0.0426 |
Weighted residual factors for significantly intense reflections | 0.1048 |
Weighted residual factors for all reflections included in the refinement | 0.1188 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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