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Information card for entry 4075746
Preview
Coordinates | 4075746.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H38 N2 Ru2 |
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Calculated formula | C30 H38 N2 Ru2 |
SMILES | [Ru]12345(N[C]67=[C]8([Ru]9%10%11%12%13%14%156([CH]7=[C]6%10C=CC=C[C]%116=[CH]89)[c]6([c]%12([c]%13([c]%14([c]%156C)C)C)C)C)N1)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C |
Title of publication | Dinuclear Ruthenium(II) κ2-Diamido/η6-Naphthalene Complexes Featuring a Coordinatively Unsaturated yet Highly π-Basic (η5-C5Me5)Ru Diamide Fragment |
Authors of publication | Takemoto, Shin; Oshio, Shinya; Shiromoto, Takayuki; Matsuzaka, Hiroyuki |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 5 |
Pages of publication | 801 |
a | 14.492 ± 0.006 Å |
b | 15.164 ± 0.006 Å |
c | 24.876 ± 0.008 Å |
α | 90° |
β | 92.62 ± 0.03° |
γ | 90° |
Cell volume | 5461 ± 4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1243 |
Residual factor for significantly intense reflections | 0.0782 |
Weighted residual factors for significantly intense reflections | 0.1781 |
Weighted residual factors for all reflections included in the refinement | 0.1972 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.142 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4075746.html
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