Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4075779
Preview
Coordinates | 4075779.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H53 Cl N5 Re |
---|---|
Calculated formula | C52 H53 Cl N5 Re |
SMILES | [Re](Cl)(C#[N]c1c(cccc1C)C)(C#[N]c1c(cccc1C)C)(C#[N]c1c(cccc1C)C)(C#[N]c1c(cccc1C)C)C#[N]c1c(cccc1C)C.c1ccc(cc1)C |
Title of publication | Spectroscopic and Computational Investigations of the Temperature-Dependent Emission Behavior of [Re(CNx)5Cl] and [Re(CNx)6]+Complexes |
Authors of publication | Villegas, John M.; Stoyanov, Stanislav R.; Reibenspies, Joseph H.; Rillema, D. Paul |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 3 |
Pages of publication | 395 |
a | 10.159 ± 0.004 Å |
b | 21.548 ± 0.004 Å |
c | 21.411 ± 0.004 Å |
α | 90° |
β | 92.286 ± 0.003° |
γ | 90° |
Cell volume | 4683 ± 2 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0699 |
Residual factor for significantly intense reflections | 0.0538 |
Weighted residual factors for significantly intense reflections | 0.137 |
Weighted residual factors for all reflections included in the refinement | 0.1506 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4075779.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.