Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4075942
Preview
Coordinates | 4075942.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 1,1,2,2-tetramethyl-1,2-bis[(2,6-dimethylbenzoyl)oxy]disilane |
---|---|
Formula | C22 H30 O4 Si2 |
Calculated formula | C22 H30 O4 Si2 |
SMILES | [Si]([Si](C)(C)OC(=O)c1c(cccc1C)C)(C)(C)OC(=O)c1c(cccc1C)C |
Title of publication | Disilanes Containing Two High-Coordinate Silicon Atoms Bridged by Carboxylate Ligands: Synthesis, Structure, and Dynamic Behavior |
Authors of publication | Kano, Naokazu; Nakagawa, Norikiyo; Shinozaki, Yasuhiro; Kawashima, Takayuki; Sato, Yuki; Naruse, Yuji; Inagaki, Satoshi |
Journal of publication | Organometallics |
Year of publication | 2005 |
Journal volume | 24 |
Journal issue | 12 |
Pages of publication | 2823 |
a | 8.577 ± 0.002 Å |
b | 8.599 ± 0.0019 Å |
c | 17.598 ± 0.004 Å |
α | 97.626 ± 0.006° |
β | 98.156 ± 0.006° |
γ | 115.882 ± 0.007° |
Cell volume | 1128 ± 0.5 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.048 |
Residual factor for significantly intense reflections | 0.0395 |
Weighted residual factors for significantly intense reflections | 0.0948 |
Weighted residual factors for all reflections included in the refinement | 0.1013 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4075942.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.