Information card for entry 4076082

Structure parameters

• Formula: C32 H54 N2 P2 Ru Si4
• Calculated formula: C32 H54 N2 P2 Ru Si4
• SMILES: C1[P]2(c3ccccc3)[Ru]34567(N([Si]1(C)C)[Si](C[P]5(C[Si](C)(C)N4[Si](C2)(C)C)c1ccccc1)(C)C)[CH]1=[CH]3CC[CH]6=[CH]7CC1
• Title of publication: Intramolecular C−H and N−H Transfer by Ruthenium(II) Amidophosphine Complexes
• Authors of publication: Fryzuk, Michael D.; Petrella, Michael J.; Patrick, Brian O.
• Journal of publication: Organometallics
• Year of publication: 2005
• Journal volume: 24
• Journal issue: 22
• Pages of publication: 5440
• a: 11.1134 ± 0.0011 Å
• b: 10.8541 ± 0.0011 Å
• c: 17.9936 ± 0.0019 Å
• α: 90°
• β: 96.944 ± 0.003°
• γ: 90°
• Cell volume: 2154.6 ± 0.4 ų
• Cell temperature: 188 ± 2 K
• Ambient diffraction temperature: 188 ± 2 K
• Number of distinct elements: 6
• Space group number: 13
• Hermann-Mauguin space group symbol: P 1 2/n 1
• Hall space group symbol: -P 2yac
• Residual factor for all reflections: 0.0436
• Residual factor for significantly intense reflections: 0.0328
• Weighted residual factors for significantly intense reflections: 0.0844
• Weighted residual factors for all reflections included in the refinement: 0.0885
• Goodness-of-fit parameter for all reflections included in the refinement: 0.972
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No