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Information card for entry 4076175
Preview
| Coordinates | 4076175.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H23 N O3 Ru |
|---|---|
| Calculated formula | C19 H23 N O3 Ru |
| SMILES | [Ru]12345678(C9C%10([CH]4=[CH]3[C]2(=[CH]19)OC)/C(=C(\OC)C)C(=O)N(C%10)C)[cH]1[cH]8[cH]7[cH]6[cH]51 |
| Title of publication | Influence of Halide Ion and Lewis Acid in the Demetalation of a Spirolactam Cyclohexadienyl Ruthenium Complex |
| Authors of publication | Pigge, F. Christopher; Coniglio, John J.; Rath, Nigam P. |
| Journal of publication | Organometallics |
| Year of publication | 2005 |
| Journal volume | 24 |
| Journal issue | 22 |
| Pages of publication | 5424 |
| a | 12.8409 ± 0.0002 Å |
| b | 12.3144 ± 0.0002 Å |
| c | 11.4854 ± 0.0002 Å |
| α | 90° |
| β | 112.367 ± 0.001° |
| γ | 90° |
| Cell volume | 1679.52 ± 0.05 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0402 |
| Residual factor for significantly intense reflections | 0.0272 |
| Weighted residual factors for significantly intense reflections | 0.0607 |
| Weighted residual factors for all reflections included in the refinement | 0.0676 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4076175.html
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Users of the data should acknowledge the original authors of the
structural data.