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Information card for entry 4076740
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Coordinates | 4076740.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [Et4N][Ru(Sxylyl)4Cl] ? |
---|---|
Formula | C41 H58 Cl3 N Ru S4 |
Calculated formula | C41 H58 Cl3 N Ru S4 |
SMILES | c1(c(cccc1C)C)S[Ru](Cl)(Sc1c(cccc1C)C)(Sc1c(cccc1C)C)Sc1c(cccc1C)C.C(C)[N+](CC)(CC)CC.C(Cl)Cl |
Title of publication | σ-Acetylide Complexes of Ruthenium(IV) and Osmium(IV) Thiolates |
Authors of publication | Zhang, Qian-Feng; Lai, Chui-Ying; Wong, Wai-Yeung; Leung, Wa-Hung |
Journal of publication | Organometallics |
Year of publication | 2002 |
Journal volume | 21 |
Journal issue | 19 |
Pages of publication | 4017 |
a | 13.4154 ± 0.0008 Å |
b | 15.7625 ± 0.0009 Å |
c | 21.1569 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4473.8 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0817 |
Residual factor for significantly intense reflections | 0.0385 |
Weighted residual factors for significantly intense reflections | 0.0853 |
Weighted residual factors for all reflections included in the refinement | 0.103 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.762 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4076740.html
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