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Information card for entry 4076756
Preview
Coordinates | 4076756.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H60 N2 P2 Ru |
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Calculated formula | C42 H60 N2 P2 Ru |
SMILES | [Ru]12345([P](CC[P]1(C(C)C)C(C)C)(C(C)C)C(C)C)([c]1([c]5([c]4([c]3([c]21C)C)C)C)C)C#CC(n1nccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Reactivity of the Electron-Rich Allenylidene−Ruthenium Complexes [Cp*Ru{CCC(R)Ph}(dippe)][BPh4] (R = H, Ph). X-Ray Crystal Structure of a Novel Dicationic Ruthenium Carbyne (Cp* = C5Me5; dippe = 1,2-bis(diisopropylphosphine)ethane) |
Authors of publication | Bustelo, Emilio; Jiménez-Tenorio, Manuel; Mereiter, Kurt; Puerta, M. Carmen; Valerga, Pedro |
Journal of publication | Organometallics |
Year of publication | 2002 |
Journal volume | 21 |
Journal issue | 9 |
Pages of publication | 1903 |
a | 9.851 ± 0.003 Å |
b | 10.557 ± 0.003 Å |
c | 37.831 ± 0.009 Å |
α | 90° |
β | 95.42 ± 0.01° |
γ | 90° |
Cell volume | 3916.7 ± 1.9 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0494 |
Residual factor for significantly intense reflections | 0.0471 |
Weighted residual factors for significantly intense reflections | 0.0961 |
Weighted residual factors for all reflections included in the refinement | 0.097 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.316 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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