Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4076871
Preview
Coordinates | 4076871.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H32 Cl N2 V |
---|---|
Calculated formula | C22 H32 Cl N2 V |
SMILES | [c]12([cH]3[cH]4[cH]5[cH]1[V]16782345([c]2([cH]8[cH]7[cH]6[cH]12)C1CCN(C)CC1)Cl)C1CCN(C)CC1 |
Title of publication | Synthesis and Structure of Amino-Functionalized Cyclopentadienyl Vanadium Complexes and Evaluation of Their Butadiene Polymerization Behavior |
Authors of publication | Bradley, Sam; Camm, Kenneth D.; Furtado, Stephen J.; Gott, Andrew L.; McGowan, Patrick C.; Podesta, Thomas J.; Thornton-Pett, Mark |
Journal of publication | Organometallics |
Year of publication | 2002 |
Journal volume | 21 |
Journal issue | 16 |
Pages of publication | 3443 |
a | 7.4989 ± 0.0013 Å |
b | 10.0473 ± 0.0014 Å |
c | 15.745 ± 0.003 Å |
α | 106.673 ± 0.011° |
β | 93.165 ± 0.007° |
γ | 102.437 ± 0.011° |
Cell volume | 1101 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0664 |
Residual factor for significantly intense reflections | 0.0568 |
Weighted residual factors for significantly intense reflections | 0.1436 |
Weighted residual factors for all reflections included in the refinement | 0.1517 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4076871.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.