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Information card for entry 4077448
Preview
| Coordinates | 4077448.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H45 F6 N2 O P Ru Si |
|---|---|
| Calculated formula | C25 H45 F6 N2 O P Ru Si |
| SMILES | [Ru]123456([N](C(C)C)=C(N(C(C)C)C6[Si](C)(C)C)C)([c]6([c]5([c]4([c]3([c]2([c]16C)C)C)C)C)C)C#[O].[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Ruthenium Amidinato−Carbene Complexes Containing a Ru−Si Bond: Formation and Reversible α-Silyl Group Migration from the Metal to the Carbene Ligand |
| Authors of publication | Hayashida, Taizo; Nagashima, Hideo |
| Journal of publication | Organometallics |
| Year of publication | 2001 |
| Journal volume | 20 |
| Journal issue | 24 |
| Pages of publication | 4996 |
| a | 22.25 ± 0.004 Å |
| b | 9.234 ± 0.003 Å |
| c | 15.137 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3110 ± 1.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.1777 |
| Residual factor for significantly intense reflections | 0.0498 |
| Weighted residual factors for significantly intense reflections | 0.1263 |
| Weighted residual factors for all reflections included in the refinement | 0.173 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.898 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4077448.html
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