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Information card for entry 4077652
Preview
Coordinates | 4077652.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Tris(trimethylsilyl)bismutan-tri-ethylgallium-Addukt |
---|---|
Formula | C15 H42 Bi Ga Si3 |
Calculated formula | C15 H42 Bi Ga Si3 |
SMILES | [Bi]([Si](C)(C)C)([Si](C)(C)C)([Si](C)(C)C)[Ga](CC)(CC)CC |
Title of publication | Synthesis and X-ray Crystal Structures of Novel Al−Bi and Ga−Bi Compounds† |
Authors of publication | Kuczkowski, Andreas; Thomas, Florian; Schulz, Stephan; Nieger, Martin |
Journal of publication | Organometallics |
Year of publication | 2000 |
Journal volume | 19 |
Journal issue | 26 |
Pages of publication | 5758 |
a | 15.0169 ± 0.001 Å |
b | 10.0777 ± 0.0007 Å |
c | 17.0582 ± 0.0008 Å |
α | 90° |
β | 91.649 ± 0.004° |
γ | 90° |
Cell volume | 2580.4 ± 0.3 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0604 |
Residual factor for significantly intense reflections | 0.0434 |
Weighted residual factors for significantly intense reflections | 0.0984 |
Weighted residual factors for all reflections included in the refinement | 0.1023 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.981 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4077652.html
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