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Information card for entry 4077677
Preview
| Coordinates | 4077677.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H20 Se5 W |
|---|---|
| Calculated formula | C18 H20 Se5 W |
| SMILES | [W]1234567([Se]C1=C([Se][Se]2)c1ccccc1)([Se][Se]3)[c]1([c]4([c]5([c]6([c]71C)C)C)C)C |
| Title of publication | Synthesis of New Selenium- and Oxygen-Containing Tungsten Acetylide Complexes [(η5-C5Me5)W(O)(Se2)(CCPh)] and [(η5-C5Me5)W(Se5CCPh)] |
| Authors of publication | Mathur, Pradeep; Ahmed, Moawia O.; Dash, Aswini K.; Kaldis, John H. |
| Journal of publication | Organometallics |
| Year of publication | 2000 |
| Journal volume | 19 |
| Journal issue | 5 |
| Pages of publication | 941 |
| a | 7.191 ± 0.002 Å |
| b | 8.353 ± 0.002 Å |
| c | 17.93 ± 0.005 Å |
| α | 100.669 ± 0.006° |
| β | 93.552 ± 0.005° |
| γ | 99.281 ± 0.008° |
| Cell volume | 1039.8 ± 0.5 Å3 |
| Cell temperature | 299 ± 2 K |
| Ambient diffraction temperature | 299 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0512 |
| Residual factor for significantly intense reflections | 0.0317 |
| Weighted residual factors for all reflections | 0.0724 |
| Weighted residual factors for significantly intense reflections | 0.0661 |
| Goodness-of-fit parameter for all reflections | 0.891 |
| Goodness-of-fit parameter for significantly intense reflections | 0.952 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.